Recenzie Reliability Analysis and Plans for Successive Testing

Reliability Analysis and Plans for Successive Testing

Reliability Analysis and Plans for Successive Testing

Balakrishnan, Narayanaswamy (Professor of Statistics, Department of Mathematics and Statistics McMaster University Hamil

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Podrobnosti

Nakladateľ: Elsevier Science Publishing Co Inc
Kód:
Rok vydania: 2021
Jazyk: Angličtina
Väzba: Pevná
Počet strán: 266
Šírka balenia: 15.9 cm
Výška balenia: 23.8 cm
Hĺbka balenia: 2 cm
Váha balenia: 554 g