Recenzie Metrology and Physical Mechanisms in New Generation Ionic Devices

Metrology and Physical Mechanisms in New Generation Ionic Devices

Metrology and Physical Mechanisms in New Generation Ionic Devices

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. prečítať celé 

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