Sortiment Taylor & Francis Inc: Technické vedy
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Capehart, Barney L., Ph.D., CEM; Turner, Wayne C., Ph.D., PE, CEM; Kennedy, William J., Ph.D., PE
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Copson, Malcolm (Consulting Engineer, UK); Kendrick, Peter (Consulting Engineer, UK); Beresford, Steve (Consulting Engin
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Girolami, Mark; Rogers, Simon
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Rierson, Leanna (Digital Safety Consulting, Wichita, Kansas, USA)
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Hiemenz, Paul C. (Emeritus -Cal State Polytechnic University, Pomona, CA); Lodge, Timothy P. (University of Minnesota-Tw
Dostupné
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Jan Dulka
Dostupné
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Bird Larry, Johnson Earvin Magic, MacMullan Jackie
Dostupné
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Roser, Christoph (Karlsruhe University of Applied Sciences, Germany)
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Jones, Owen
Dostupné
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Riley, David
Dostupné
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Kremers, Rudolf
Dostupné
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Tapping, Don (MCS Media, Chelsea, MI, USA); Luyster, Tom (Standard Lean Manufacturing Systems, Inc., Jacksonville, FL, U
Dostupné
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Gibson, Ronald F. (University of Nevada, Reno, USA)
Dostupné
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Fast, Larry E. (Founder and President, Pathways to Manufacturing Excellence, LLC)
Dostupné
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Kim, Doyub (Microsoft, CA, USA)
Dostupné
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Taylor, Travis S. (Author and Consultant, Huntsville, Alabama USA)
Dostupné
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Ohno, Taiichi
Dostupné
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Fischer-Cripps, Anthony C.
Dostupné
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Blackburn, J. Lewis (Consultant, Bothell, Washington, USA); Domin, Thomas J. (PPL, Inc., Allentown, Pennsylvania, USA)
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Sierksma, Gerard (University of Groningen, The Netherlands); Sierksma, Gerard (University of Groningen, The Netherlands)
Dostupné